The Growing Electron Microscopy Group at Covalent’s Silicon Valley lab significantly expands its team and instrument portfolio for FIB-SEM and S/TEM analysis. Sunnyvale, CA.  Covalent Metrology, a leading provider of analytical services in North America, announces the installation of two new Thermo Fisher Scientific Helios 5 UC DualBeam focused-ion-beam scanning electron microscopes (FIB-SEMs). Covalent now has […]

For the correlative analysis of Raman, AFM, AFM-Raman, cathodoluminescence and fluorescence data and microscopy images (optical, scanning probe microscopy, electron microscopy) Palaiseau, Saclay Campus, France, and Besançon, France World leader in Raman microscopy and nanoscopy, HORIBA Scientific and Digital Surf, creator of the Mountains® software platform for image and surface analysis in microscopy and metrology, […]

Wetzlar, Germany – Leica Microsystems, a leading provider of microscopy and scientific instruments, has introduced the new Coral Cryo workflow solution. The workflow solution enables researchers to increase their success rate in cryo-electron tomography experiments through high precision confocal 3D targeting. Coral Cryo is ready to deploy and supports reproducibility by reducing and optimizing the […]

The ebsd.com website has been significantly updated and improved. This free education and training resource for anyone working in materials characterization using scanning electron microscopy from Oxford Instruments now provides a wealth of additional information on how to get the best results from this important analytical technique. Since 2003, Oxford Instruments has used the website […]

Prof. Vladimir Matolín of the Nanomaterials Group at Charles University, Prague, can now include an EnviroESCA to his impressive list of equipment! We recently installed our state-of-the-art, high-throughput NAP-XPS system into his lab, which allows for XPS characterization of surfaces under pressures of up to tens of millibars. The key benefits of the EnviroESCA come from the […]

Advanced semiconductor circuit edit system enables customers to quickly resolve preproduction design flaws and maintain device integrity and function Hillsboro, Ore., Feb. 16, 2021—Thermo Fisher Scientific Inc., the world leader in serving science, today introduced the Thermo Scientific Centrios HX Circuit Edit System. This state-of-the-art circuit edit solution allows semiconductor manufacturers to optimize success rates with […]

MAHWAH, NJ – EDAX, LLC, a leader in X-ray microanalysis and electron diffraction instrumentation, has added the Clarity™ Super to its Electron Backscatter Diffraction (EBSD) product line. The Clarity EBSD Detector Series is the first commercially available direct detector system designed for EBSD applications. The series includes the original Clarity, now called the Clarity Plus, […]

Founded in 2019, ELDICO Scientific embarked on an ambitious journey: The company wants to make electron diffraction, a promising analytical technique for nano-scale research, easy and accessible to the industry and academia. This February, ELDICO is about to put its first dedicated electron diffractometer into operation at Europe’s first electron diffraction platform hosted by the Switzerland Innovation Park […]

Founded in 2019, ELDICO Scientific embarked on an ambitious journey: The company wants to make electron diffraction, a promising analytical technique for nano-scale research, easy and accessible to the industry and academia. This February, ELDICO is about to put its first dedicated electron diffractometer into operation at Europe’s first electron diffraction platform hosted by the Switzerland Innovation Park […]

LEHIGH ACRES, Fla. — EXpressLO LLC is the most comprehensive provider of focused ion beam (FIB) ex situ lift out (EXLO) specimen preparation solutions for transmission electron microscopy (EM) and other analytical techniques. As of January 27, 2022, EXpressLO LLC submitted a patent application to the U.S. Patent and Trademark Office describing highly innovative methods and apparatus for […]